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tunneling microscopy

См. также в других словарях:

  • Spin polarized scanning tunneling microscopy — (SP STM) is a specialized application of scanning tunneling microscopy (STM) that can provide detailed information of magentic phenomena on the single atom scale additional to the atomic topology gained with STM. SP STM was developed by Roland… …   Wikipedia

  • scanning tunneling microscopy — rastrinė tunelinė mikroskopija statusas T sritis chemija apibrėžtis Ypač didelės skyros mikroskopijos metodas. atitikmenys: angl. scanning tunneling microscopy rus. растровая туннельная микроскопия …   Chemijos terminų aiškinamasis žodynas

  • scanning tunneling microscopy — noun see scanning tunneling microscope …   New Collegiate Dictionary

  • scanning tunneling microscopy — noun see scanning tunneling microscope …   Useful english dictionary

  • Microscopy Listserver — The Microscopy Listserver [1] is a network based discussion forum giving members of the scientific community a centralized Internet address to which questions/comments/answers in the various fields of Microscopy or Microanalysis can be rapidly… …   Wikipedia

  • Microscopy — is the technical field of using microscopes to view samples and objects that cannot be seen with the unaided eye (objects that are not within the resolution range of the normal eye). There are three well known branches of microscopy, optical,… …   Wikipedia

  • Scanning tunneling microscope — Image of reconstruction on a clean Gold(100) surface …   Wikipedia

  • Scanning probe microscopy — Part of a series of articles on Nanotechnology …   Wikipedia

  • Scanning tunneling spectroscopy — (STS) is a powerful experimental technique in scanning tunneling microscopy (STM) that uses a scanning tunneling microscope (STM) to probe the local density of electronic states (LDOS) and band gap of surfaces and materials on surfaces at the… …   Wikipedia

  • Photoconductive atomic force microscopy — (pc AFM) is a scientific technique.. Multi layer photovoltaic cells have gained popularity since mid 1980s.[1] At the time, research was primarily focused on single layer photovoltaic (PV) devices between two electrodes, in which PV properties… …   Wikipedia

  • Conductive atomic force microscopy — (C AFM) is a variation of atomic force microscopy (AFM) and scanning tunneling microscopy (STM), which uses electrical current to construct the surface profile of the studied sample. The current is flowing through the metal coated tip of the… …   Wikipedia

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